Application of Atomic Force Microscopy (AFM) in Polymer Materials
نویسنده
چکیده
Atomic force microscopy (AFM) is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution. AFM is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer blends.
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تاریخ انتشار 2007